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MuAnalysis Report List

*Report
 
Cree CGH40010 GaN HEMT Teardown Report-short version
Table of Contents Published: 2009/10
Much has been published about GaN transistors but very few are available commercially. MuAnalysis has taken apart the Cree CGH40010 GaN HEMT. ...

Seoul Semiconductor Z-Power LED P9 Series Teardown and Technology Analysis
Table of Contents Published: 2009/03
Reported to contain a SemiLEDs die on flexible copper substrate and the subject of much controversy and feuding between Nichia and Seoul Semiconductor, this device has indeed a very interesting die. ...

Nichia Jupiter LED Lamp Teardown and Technology Analysis
Table of Contents Published: 2009/01
The low-profile package is very straightforward in concept and design, and uses materials which are typical in the high-power LED industry. As the LED die substrate is electrically insulating, there is no back-side contact to the die. Three bond wires for ...

OSRAM Platinum Dragon LED Teardown and Technology Analysis
Table of Contents Published: 2008/06
The LED technology of the Osram Dragon cool white high-power LED lamp is at a level of development similar to its competitors. ...

CREE XLamp LED Lamp Teardown and Technology Analysis
Table of Contents Published: 2008/04
The Cree X-Lamp, housed in a low-profile package, is designed with considerable attention to efficient extraction of the emitted light. ...

Lumileds Luxeon K2 LED LampTeardown and Technology Analysis
Table of Contents Published: 2008/04
The device is a surface mount gull wing device containing a GaN LED chip. Considerable attention has been paid to current distribution, heat dissipation, and to reflectivity in this device. ...

Lumileds Luxeon Rebel LED Lamp Teardown and Technology Analysis
Table of Contents Published: 2008/03
MuAnalysis has used a large variety of analytical techniques including IR-laser scanning microscopy, electron microscopy with photochemical delineation, EDX and FTIR spectroscopy to probe the insides of this LED lamp and reveal its secrets. Back-side appe ...

Infineon vs. CREE 6 Amp SiC Schottky Diode Teardown and Technology Analysis
Table of Contents Published: 2008/02
These devices may look the same and be interchangeable in your product but inside they have widely different technologies. MuAnalysis has used a large variety of analytical techniques including Optical Beam Induced Current (OBIC), electron microscopy as w ...

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