Abstract
These devices may look the same and be interchangeable in your product but inside they have widely different technologies. MuAnalysis has used a large variety of analytical techniques including Optical Beam Induced Current (OBIC), electron microscopy as well as Raman and FTIR spectroscopy to probe the insides of these high power diodes and reveal their secrets. Schottky contact, passivation, edge structure, back contact, crystalline orientation are described in details with plenty of photos. | 
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