the-infoshop.com - The vertical markets research portal
View CartView Cart
Global Information, Inc.
US: +1-860-674-8796
EU: +32-2-535-7543
SG: +65-6223-2436
  Home | Category | Publishers | Custom Research | E-mail Alert | About Us | Contact Us | Site Map |
 

* View All Categories
View Conferences
Japanese Korean Chinese

Market Research Report

Microscopy Markets

Published by Trimark Publications Contact us : +1-860-674-8796
Published 2008/07 Content info 134 pages
Product code TK70125
Price From  US $ 3400 Order/Price list
US $ 3400 PDF by E-mail (Single User License)
US $ 6800 PDF By E-mail (Unlimited User License)

Delivery Time
PDF by E-Mail
Approx. 1-2 business days
Hard Copy/CD-ROM
Approx. 3-4 business days
If you need expedited delivery, please call us.
Description TOC

Table of Contents

  • 1 Overview
    • 1.1 Statement of Report
    • 1.2 Scope of This Report
    • 1.3 Objectives
    • 1.4 Methodology
    • 1.5 Aims of This Report
    • 1.6 Executive Summary
    • 1.7 Trends and Conclusions
  • 2 Introduction to Microscopy Markets
    • 2.1 Overview of Microscopy Technologies
      • 2.1.1 Introduction
      • 2.1.2 Basic Optical Microscopy (OM)
      • 2.1.3 Electron Microscopy (EM) and Other Charged-Particle Technologies
      • 2.1.4 Advanced Optical Microscopy
      • 2.1.5 Scanning Probe Microscopy (SPM)
      • 2.1.6 Fourier Transform Infrared Microscopy (FT-IR)
      • 2.1.7 Ultraviolet Microscopy (UVM)
      • 2.1.8 Scanning Acoustic Microscopy (SAM)
      • 2.1.9 X-Ray Microscopy / Microtomography (MCT, XMT, Micro-CT)
    • 2.2 Market Perspective
    • 2.3 Market Analysis
      • 2.3.1 Market Size
      • 2.3.2 Market Share
      • 2.3.3 Key Players
      • 2.3.4 Competition
      • 2.3.5 Barriers to Growth
      • 2.3.6 Market Drivers
    • 2.4 Purchasers' Perspectives
  • 3 In-Depth Discussion of Optical (Light) Microscopy (OM)
    • 3.1 Lens Systems
    • 3.2 Resolution
    • 3.3 Illumination Systems
    • 3.4 Innovations
      • 3.4.1 Stereo Microscopes
    • 3.5 Major Applications of Optical Microscopy
      • 3.5.1 Semiconductor Manufacturing
      • 3.5.2 Automated Medical Imaging
      • 3.5.3 Market Drivers for Automated Systems for Semiconductor and Medical Applications
      • 3.5.4 Real-Time Imaging
  • 4 In-Depth Discussion of Light-Based Fluorescence, Multi-Photon and Confocal Microscopy
    • 4.1 Fluorescence Microscopy
    • 4.2 Total Internal Reflection Fluorescence Microscopy (TIRFM)
    • 4.3 Multi-Photon Microscopy
      • 4.3.1 Basic Principles
      • 4.3.2 Lasers
      • 4.3.3 Fluorophores for Multi-Photon Work
      • 4.3.4 Uncaging
      • 4.3.5 Autofluorescence
    • 4.4 Laser Scanning Confocal Microscopy (Confocal, LSCM)
      • 4.4.1 Basic Principles
      • 4.4.2 Confocal System Types
      • 4.4.3 Photobleaching
    • 4.5 High-Throughput Fluorescence and Confocal Imaging Systems
    • 4.6 Major Players and Products in Optical, Fluorescence, Multi-Photon and Confocal Microscopy
      • 4.6.1 BD (Becton, Dickinson and Company)
      • 4.6.2 KLA-Tencor Corporation
      • 4.6.3 Korima, Inc.
      • 4.6.4 Leica Microsystems, Inc.
      • 4.6.5 Nikon Instruments, Inc.
      • 4.6.6 Nanomics Imaging, Inc.
      • 4.6.7 Olympus Imaging America, Inc.
      • 4.6.8 Veeco Instruments, Inc.
      • 4.6.9 Carl Zeiss Microimaging, Inc.
      • 4.6.10 Modular Confocal Scanners
  • 5 In-Depth Discussion of Scanning Probe Microscopy (SPM), Including Near-Field (NSOM) and Atomic Force Microscopy (AFM)
    • 5.1 Introduction
    • 5.2 Near-Field Scanning Optical Microscopy (NSOM)
      • 5.2.1 Resonance Frequency
      • 5.2.2 Aperture
      • 5.2.3 Reflection Mode
    • 5.3 Near-Field Scanning Thermal Microscopy (NThM)
    • 5.4 Atomic Force Microscopy (AFM)
      • 5.4.1 Semiconductor Applications
      • 5.4.2 Magnetic Material Applications
      • 5.4.3 Electrochemical Applications
      • 5.4.4 Life Sciences Applications
    • 5.5 Major Players and Products in Scanning Probe Microscopy (Including Near-Field and Atomic Force)
      • 5.5.1 Agilent Technologies
      • 5.5.2 Asylum Research
      • 5.5.3 JEOL USA, Inc.
      • 5.5.4 KLA-Tencor Corporation
      • 5.5.5 Nanonics Imaging, Ltd.
      • 5.5.6 Omicron NanoTechnology GmbH
      • 5.5.7 Veeco Instruments, Inc.
      • 5.5.8 WITec Instruments Corp.
  • 6 In-Depth Discussion of Infrared and Ultraviolet Microscopy
    • 6.1 Fourier-Transfer Infrared Microscopy (FT-IR)
    • 6.2 Ultraviolet Microscopy (UVM)
    • 6.3 Major Players and Products for Infrared and Ultraviolet Microscopy
      • 6.3.1 Bruker Optics, Inc.
      • 6.3.2 Craic Technologies
      • 6.3.3 KLA-Tencor Corporation
      • 6.3.4 Korima, Inc.
      • 6.3.5 Thermo Scientific
  • 7 In-Depth Discussion of Scanning Acoustic Microscopy, X-Ray Microtomography and Raman Spectroscopic Microscopy
    • 7.1 Scanning Acoustic Microscopy (SAM)
    • 7.2 X-Ray Microtomography (CTM, Micro-CT)
    • 7.3 Raman Spectroscopic Microscopy
  • 8 Major Players and Products in Acoustic Microscopy, X-Ray Microtomography and Raman Microscopy
    • 8.1 Major Players in Acoustic Microscopy
      • 8.1.1 Sonix, Inc.
      • 8.1.2 Sonoscan, Inc.
    • 8.2 Major Players in X-Ray Microtomography
      • 8.2.1 Cameca Instruments, Inc.
      • 8.2.2 SkyScan
    • 8.3 Major Players in Raman Microscopy
      • 8.3.1 Horiba Jobin Yvon, Inc.
      • 8.3.2 Renishaw, Inc.
      • 8.3.3 Thermo Scientific
  • 9 In-Depth Discussion of Electron Microscopy (EM) and Related Charged-Particle Systems
    • 9.1 Transmission Electron Microscope (TEM)
      • 9.1.1 Electron Sources
    • 9.2 Scanning Electron Microscope (SEM)
      • 9.2.1 Rastering
      • 9.2.2 Exploring the Sample
      • 9.2.3 Types of Image
      • 9.2.4 Environmental SEM (ESEM) and Variable-Pressure SEM (VPSEM)
      • 9.2.5 Low-Voltage SEM
      • 9.2.6 Tabletop Models
      • 9.2.7 Applications
    • 9.3 Scanning/Transmission Electron Microscope (STEM)
    • 9.4 Electron Probe Microanalyzer (EPMA, Microprobe)
    • 9.5 Auger Electron Microscopy/Spectroscopy (AES, AEM, Auger)
    • 9.6 Electron Beam (E-Beam) Lithography
    • 9.7 Focused Ion Beam (FIB) and Dual-Beam Microscopes
    • 9.8 Secondary Ion Mass Spectrometry (SIMS)
    • 9.9 X-Ray Photoelectron Spectroscopy (XPS)/ Electron Spectroscopy for Chemical Analysis (ESCA)
    • 9.10 Scanning Helium Ion Beam Microscopy (SHIM)
  • 10 Ancillary Analytical Attachments
    • 10.1 Common/Historical Attachments
      • 10.1.1 Energy-Dispersive (EDS) and Wavelength-Dispersive (WDS) X-ray Microanalyzers
      • 10.1.2 Electron Backscatter Diffraction (EBSD)
      • 10.1.3 Cathodoluminescence (CL)
      • 10.1.4 X-Ray Microtomography
      • 10.1.5 Raman Spectroscopy
  • 11 Major Players and Products in Electron Beam and Other Charged-Particle Beam Microscopies
    • 11.1 Cameca Instruments, Inc.
    • 11.2 FEI Company
    • 11.3 Hitachi High Technologies America, Inc.
    • 11.4 JEOL USA, Inc.
    • 11.5 KLA-Tencor Corporation
    • 11.6 Omicron NanoTechnology GmbH
    • 11.7 Vistec Lithography, Inc.
    • 11.8 Carl Zeiss SMT Corporation
  • 12 Company Profiles
    • 12.1 Applied Materials, Inc.
    • 12.2 Applied Precision, Inc.
    • 12.3 Becton, Dickinson and Company
    • 12.4 Bio-Rad Laboratories, Incorporated
    • 12.5 Bruker Optics
    • 12.6 Buehler
    • 12.7 Cameca
    • 12.8 Carl Zeiss, Inc.
    • 12.9 Danish Micro Engineering A/S
    • 12.10 FEI Company
    • 12.11 Gatan
    • 12.12 Genetix
    • 12.13 Hitachi, Ltd.
    • 12.14 Inami Corp.
    • 12.15 IRIS International
    • 12.16 JEOL
    • 12.17 KLA-Tencor Corporation
    • 12.18 Leica Microsystems (part of Danaher Corporation)
    • 12.19 Medical Integrated Services (MIS)
    • 12.20 Nanonics Imaging, Ltd.
    • 12.21 Nikon, Inc.
    • 12.22 NT-MDT
    • 12.23 Obducat-CamScan
    • 12.24 Olympus Corporation
    • 12.25 Omicron Nanotechnology
    • 12.26 Pacific Nanotechnology
    • 12.27 Park Systems (formerly PSIA)
    • 12.28 PerkinElmer
    • 12.29 Quesant Instruments
    • 12.30 Questar Corporation
    • 12.31 Schott North America
    • 12.32 Shimadzu Corporation
    • 12.33 SII NanoTechnology
    • 12.34 Thermo Fisher Scientific, Inc.
    • 12.35 TM Microscopes (ThermoMicroscopes)
    • 12.36 TriPath Imaging, Inc.
    • 12.37 Veeco Instruments
    • 12.38 WITec (Wissenschaftliche Instrumente und Technologie) GmbH
  • 13 Company Directory

INDEX OF FIGURES

  • Figure 2.1: Global Market for Microscopes, Accessories and Supplies, 2003-2012
  • Figure 3.1: Basic Components of the Optical Microscope
  • Figure 3.2: Stereo Microscope

INDEX OF TABLES

  • Table 2.1: Global Market for Microscopes and Accessories, 2007-2013
  • Table 2.2: Global Market for Optical Microscopes and Accessories
  • Table 2.3: Global Market for Charged Particle Microscopes and Accessories
  • Table 2.4: Global Market for Scanning Probe Microscopes and Accessories
  • Table 3.1: Basic Components of the Optical Microscope
  • Table 5.1: Types of Scanning Probe Microscopes
Related Report
Back to Top
Please inform me when related publications are released
InfoWatch

US: 1-860-674-8796 EU: 32-2-535-7543 SG: 65-6223-2436
The vertical markets research portal
© 2009, the-infoshop.com by Global Information, Inc. All rights reserved.