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[Report]

Non-Destructive Testing Industry Review

Published: 2002/06

Contact 24 hrs/day
Description
INTRODUCTION/SUMMARY
    • ACOUSTICS
    • PRESSURE VESSEL INSPECTION
    • PROCESS CONTROL WITH ACOUSTIC SENSORS
CONTRACTS AND AWARDS
    • NIST STREAMLINES ATP AWARDS
    • AMES LAB TO ENSURE REACTOR SAFETY
    • I-PORTAL 100 WINS AVIATION AWARD
    • AFM OFFERS BEST PRODUCT
DATA ACQUISITION
    • ENVIRONMENTAL STRESS SCREENING MODULES
    • STUDY SETS MEASUREMENT MAP
    • HANDHELD COMPUTER MONITORS CORROSION
    • PCs THAT CAN SURVIVE ABUSE
    • TWO PARTNER FOR TEST SOLUTION
EDDY CURRENT
    • COPPER CMP MEASUREMENTS
    • HIGH RESOLUTION CORROSION MONITORING
    • AUTOMATIC FLAW DETECTOR
ELECTROMAGNETICS
    • ECONOMICAL LEVEL MEASUREMENTS
    • BROAD-BAND CURRENT PROBE
    • RADAR LEVEL MEASUREMENT
    • CAPACITANCE BASED LEVEL MEASUREMENT
    • WIRELESS TECHNOLOGY FOR REMOTE MONITORING
    • RADAR LEVEL MEASUREMENT
    • FASTER, SAFER LAND MINE DETECTION
    • DSP-3 METAL DETECTOR
    • RESONANT INSPECTION SYSTEM OFFERED
    • NONINVASIVE STRAIN GAUGE
    • USING RADIO WAVES TO FIND CONTRABAND
GRANTS AND PUBLICATIONS
    • ANSI TO DEVELOP STANDARDS STRATEGY
    • NEW DOE GUIDE IS OUT
    • ONLINE MEASUREMENT TRACEABILITY RESOURCE
    • KEITHLEY HANDBOOK OFFERS PRACTICAL TIPS
INDUSTRY NEWS
    • INVISION RECEIVES $7M FROM FAA
    • RESTIVO REJOINS CORRPRO AS DIRECTOR
    • ADE RECEIVES WAFER METROLOGY ORDERS
    • FLIR ALLIES WITH SCOTT
    • U.K. AIRPORT ORDERS INVISION EDS
    • JMAR RECEIVES $2.1 MILLION ORDER
    • ORDERS FOR 3D SCANNING SYSTEMS
    • RVSI ACQUIRES AUTO IMAGE ID
    • JDSU DIVISION GETS ISO CERTIFICATION
    • JMAR TEAMS WITH MALAYSIAN FOUNDRY
    • AGFA TEAMS WITH TOP IMAGE
    • X-RITE FORMS LASER SUBSIDIARY
    • INTEGRAL VISION LICENSES CORECO
    • PERKIN-ELMER BUYS APPLIED SURFACE
    • JMAR AWARDED $9.0M CONTRACT
    • COGNEX SUES ELECTRO SCIENTIFIC
    • PEI WINS $6 MILLION ORDER
    • MARINE CORPS SELECTS FLIR IMAGER
    • INVISION RECEIVES FAA ORDER
    • JDS TEAMS WITH ALCATEL
    • VEECO-ION TECH SHIPS 100TH SPECTOR
    • AGFA PROVIDES MULTI-SOLUTIONS
    • PERKINELMER TO ACQUIRE LABWORKS
    • CORRPRO LAUNCHES MATERIALS HOTLINE
    • ADE RECEIVES METROLOGY ORDER
    • COGNEX CEO WINS AWARD
    • STEELMAKER GOES WITH COGNEX
    • AS&E ANNOUNCES ISO9001 REGISTRATION
    • JMAR TO ACQUIRE SAL
    • KLA-TENCOR BUYING PHASE METRICS
    • KLA-TENCOR AND THERMA-WAVE SETTLE
    • VENTURE FIRM INTERESTED IN AGFA
    • ADE BAGS MULTIPLE ORDERS
    • JAPANESE COMPANY SELECTS COGNEX
    • CHINA CORP. SELECTS COGNEX
    • FLIR TO ACQUIRE SAAB DIVISION
    • INVISION RECEIVES EUROPEAN ORDERS
    • NDT COUNTERS AGFA'S ECONOMIC SLOWDOWN
    • SOLIDARITY FUND INVESTS IN TECHNOLOGY
    • CORRPRO RANKS IN TOP 500 DESIGN FIRMS
    • AMETEK SENSORS FOR GE AIRCRAFT ENGINES
    • PLASTIC FILM MAKER SELECTS COGNEX
    • RVSI GETS TAIWAN ORDER
    • AGFA DECLINES PURCHASE OFFER
    • METROLOGY TOOLS INTRO AT SEMICON
    • AMETEK ACQUIRES EDAX, INC.
    • IN-SIGHT SENSORS STANDARD COMPLIANT
    • COGNEX WEB INSPECTION SELECTED
    • FEI COLLABORATES WITH SEMATECH
    • FEI TO TEAM WITH KLA-TENCOR
    • INVISION DELIVERS $3M FAA ORDER
    • QUANTUM MAGNETICS PART OF ARL CONTRACT
    • KEITHLEY & CELESTRY IN COOPERATIVE DEAL
    • PHILIPS ACQUIRES AGILENT GROUP
    • VEECO SHIPS 100TH AFM
    • AGFA NDT ACQUIRES PANTAK
    • R/D TECH SIGNS $8.8M CHINA DEAL
    • PACIFICA PAPERS SELECTS COGNEX
    • QUANTUM RECEIVES CIO-100 AWARD
    • QUANTUM PART OF LARGE DOD CONTRACT
    • JMAR COMPLETES PURCHASE OF SAL, INC.
    • RVSI BAGS MULTIPLE ORDERS
    • VEECO ACQUIRES THERMOMICROSCOPES
    • ZYGO SHIPS 1,000TH GPI
    • AGFA ACQUIRES SEIFERT AND PANTAK
    • SWEDISH COMPANY BUYS WEB SYSTEM
    • INVISION RECEIVES $2M EDS ORDER
    • INVISION BAGS $16M EDS CONTRACT
    • INOVEC WINS $1.1M ORDER
    • INVISION SHIPS EDS TO CHILE
    • JMAR LICENSES EUV TECHNOLOGY
    • KEITHLEY OPENS OFFICES IN SCANDINAVIA
    • DEVICE DYNAMICS SELECTS RVSI SYSTEM
    • RVSI AUTOMATION PRODUCTS SHIFT TO NY
    • VEECO LAUNCHES NEW MRAM PROCESS
    • VEECO MERGES WITH APPLIED EPI
    • MONITORING HYDRO GENERATOR CONDITIONS
    • X9 ANALYZES MAGNETIC PROPERTIES
    • NORSKE SKOG SELECTS COGNEX
    • AS&E CEO TESTIFIES ON SECURITY
    • FUJI DONATES $1M FOR RELIEF EFFORTS
    • QUANTUM RECEIVES ARMY CONTRACT
    • INVISION EXECUTIVE TESTIFIES FOR CONGRESS
    • THERMO ELECTRON TAKES ANOTHER LOOK
    • PHILIPS ACQUIRES MARCONI MEDICAL
    • PPT VISION WINS GETS ISO 9001
    • TAIWAN COMPANY ORDERS RVSI SYSTEM
    • RVSI RECEIVES LASER SYSTEM ORDER
    • EC, EPRI SIGN COOPERATION AGREEMENT
    • FLIR AWARDED NEW CONTRACTS
    • INVISION ANNOUNCES WORLDWIDE EDS ORDERS
    • FAA ORDER I-PORTAL SYSTEMS
    • PARIS AIRPORT PLACES EDS ORDER
    • JMAR RECEIVES LITHOGRAPHY ORDER
    • WAFERTECH, TENCOR TO BOOST IC YIELDS
    • POLAROID TO SELL ID SYSTEMS
    • BRIEFLY NOTED
      • AMERICAN SCIENCE & ENGINEERING RECEIVES FUNDING
      • JDS UNIPHASE RESCHEDULES STOCKHOLDER MEETING
      • COGNEX CORP. ANNOUNCES COMMON STOCK BUYBACK
      • ZYGO RECEIVES $4.9 MILLION ORDER
      • RVSI EXPECTS LOWER REVENUE 1ST QTR 2001
INFRARED
    • HEAT DETECTS AIRCRAFT DAMAGE
    • FTIR BEST TO FIND COMBUSTION PRODUCTS
    • ANALYZING BLACK PLASTIC RECYCLABLES
    • DRUG DISCOVERY USING THERMAL IMAGING
    • DETECTING ICING ON HELICOPTER BLADES
    • DEVICE SENSES CHEMICAL WEAPONS
MACHINE VISION
    • NEW SYSTEMS FROM COGNEX
MAGNETIC SENSING
    • DETECTING ENEMY VEHICLES IN BATTLE
NEW TECHNOLOGY
    • ASME TO HIGHLIGHT NANOTECHNOLOGY
    • DNA SENSOR DETECTS LEAD
    • FIBER-OPTICS DETECT DAMAGED RAILS
    • ENERGY-SAVING SENSING DEVICE
    • ELECTRICAL CONTROL OF MICRO-FLUIDS
    • NEW SENSORS FROM LEDS
    • ULTRASONIC THICKNESS GAUGE OFFERED
    • BOLT GAGE IS IMPROVED
    • PORTABLE AIRSCAN FLAW DETECTOR
    • ULTRASONIC HEAT METER INTROS
    • DETECTING HIDDEN METAL CORROSION
    • MAGNETIC MICROIMAGERS BASED ON GMR
    • AUSSIE RADAR DETECTS THE INVISIBLE
    • E-NOSE NOSES OUT MINES
    • SPINNING IMPROVES NMR DATA
    • NANOWIRES DETECT EXPLOSIVE TRACE RESIDUES
    • "EX SITU" NMR SPECTROSCOPY
    • NANOWIRES DETECT TRACE EXPLOSIVES
    • STUDYING OFF-SHORE OIL LEAKS
    • IN-SITU REAL-TIME IR SPECTROSCOPY
    • LIQUID CRYSTAL CHEMICAL SENSORS
    • APPLYING MATH TO DETECTION TECHNOLOGY
    • DETECTING OBJECTS IN SUITCASES
    • MATERIAL IMPROVES MRI TECHNOLOGIES
    • CAMERAS THAT WORK LIKE BRAINS
    • MAPPING STRUCTURES FROM RANDOM NOISE
    • ANTHRAX DECTECTORS ARE COMING
    • SOIL AND WATER CHEMICAL SNIFFER
    • EARLY DETECTION OF CHEMICAL AGENTS
    • "STRUCTURAL RADAR" WARNS OF FAILURE
    • PNNL TECHNOLOGY FOR SECURITY
OPTICAL
    • INTERFEROMETER MAKES ACCURATE MEASUREMENTS
    • CONCURRENT MEASUREMENT FOR AUTOMOTIVE PARTS
    • ADVANCED MICRO-OPTIC METROLOGY SYSTEM
    • WAFER INSPECTION BREAKTHROUGH
    • VIDEOSCOPE FOR AIRCRAFT INSPECTION
    • HIGH SPEED INSPECTION SYSTEM
    • WEB-BASED MACHINE VISION SYSTEM
    • JDS SPECTROMETER BAGS AWARD
    • SILICON PHOTOSENSOR SEES LIKE HUMAN EYE
    • LASER DIODE AND THIN FILM INSPECTION
    • LASER MEASURING SYSTEM INTROS
    • COATING THICKNESS MEASUREMENTS
    • SURFACE MEASUREMENT SYSTEM OFFERED
    • 3D VIDEO LASER PROBE
    • DEWPOINT MONITOR FOR NATURAL GAS
    • FLEXBAR FIBEROPTIC FLEXIBLE BORESCOPE
    • MACHINE VISION FOR COPPER PICKLING
    • SPEEDING UP DIMENSION INSPECTION
    • FIBER OPTIC TEST SYSTEM
    • PORTABLE CHEMICAL ANALYZER DEVELOPED
    • LASER-BASED LAB MICROMETER
    • TWO NEW VISION SYSTEMS
    • COLOR MACHINE VISION SENSOR
    • SPECTROSCOPIC CRITICAL DIMENSION METROLOGY
    • ADVANCES IN SMART CAMERAS
    • ZERO DEFECT INSPECTION SYSTEM
    • LOW-COST MACHINE VISION SYSTEM
    • HIGH-THROUGHPUT WAFER INSPECTION
    • WAFER INSPECTION AT 50 NANOMETERS
    • WAFER BOW AND STRESS MEASUREMENTS
    • METAL SURFACE INSPECTION SYSTEM
    • QUANTITATIVE ANALYSIS USING OE SPECTROMETRY
    • 3D COPLANARITY SCANNING SYSTEM
    • DEFECT ZERO QUALITY ASSURANCE
    • BUMPED WAFER INSPECTION SYSTEM
    • NETWORKABLE IN-SIGHT VISION SENSORS
    • HIGH EFFICIENCY EUV GENERATION
    • INTEGRATED METROLOGY AT 300 MM
    • WEB-BASED SMART SENSORS
    • OCR TOOLS EXPAND COGNEX SENSOR LINE
    • IN-LINE AUTOMATIC WEB INSPECTION
    • INNOVATIVE DAYTIME CORONA CAMERA
    • RECON DIGITAL INSPECTION SYSTEM
    • LIGHT SOURCE FOR BETTER INSPECTIONS
    • UTILITY AERIAL INSPECTION SYSTEM
    • HANDHELD REMOTE INSPECTION SYSTEM
    • WAFER INSPECTION TECHNOLOGY
    • TERASTAR RETICLE INSPECTION TOOL
    • MARK AND LEAD INSPECTION SYSTEM
    • SELF-AUTHENTICATION FOR SECURE ID
    • SOFTWARE ENHANCES VIDEO PROBE
OUTLOOK
    • WHAT'S AHEAD IN 2001
RADIOGRAPHICS
    • RELIABILITY ANALYSIS OF SMARTCARDS
    • IDENTIFYING MOLECULES IN STMS
    • MATERIAL IMPROVES MRI PERFORMANCE
    • TECHNIQUE PREDICTS LIFE OF RUBBER
    • FULLY-AUTOMATED 3-D METROLOGY SYSTEM
    • ADE SHOWCASES AT SEMICON EUROPA
    • ADE PRODUCTS AT SEMICON EUROPA
    • FUGIFILM DEBUTS IMAGE ANALYZER
    • EXPLOSIVE DETECTION TECHNOLOGY PATENTED
    • HIGH-TECH SCHOOL SECURITY SYSTEM
    • QUANTUM MAGNETICS AWARDED QR PATENT
    • INSCAN X-RAY IMAGING SYSTEMS
    • IMPROVED X-RAY INSPECTION SYSTEM
    • NONINVASIVE LIVER IRON MEASUREMENT
    • FEI INTRODUCES TECNAI G2 TEM
    • SURFACE ANALYZER FOR CHEMICALS
    • DIGITAL X-RAY SCANNER
    • IMAGING WEAPONS DETECTION SYSTEM
    • BODYSEARCH X-RAY INSPECTION SYSTEMS
    • STRUCTURAL DIAGNOSTICS ON ANY MATERIAL
    • QUANTUM WINS AVIATION SECURITY AWARD
    • YIELD MANAGEMENT BREAKTHROUGH
    • E-BEAM INSPECTION SYSTEM WINS AWARD
SOFTWARE
    • CORECO IMAGING RELEASES WIT 7.0
    • REPORTER MONITORS OPEN CHANNELS
    • KLA-TENCOR, ASML DEVELOP JOINT METROLOGY
    • PROGRAM IMPROVES MACHINE VISION
    • SOFTWARE MINIMIZES OPERATOR ERROR
    • YIELD ANALYSIS FOR IC DEVELOPMENT
    • ONLINE SUPPORT PILOT PROGRAM
    • WEB-BASED RECIPE MANAGEMENT SERVICE
    • YIELD MANAGEMENT FOR DATA MINING
    • RETICLE INSPECTION SOFTWARE
    • INSPECTING, MAINTAINING TRANSMISSION LINES
    • THERMOVISION LABVIEW TOOLKIT
    • KEITHLEY 4200-SCS SOFTWARE UPGRADE
    • WINDOWS 2000 TO WINDOWS XP MIGRATION
    • REMOTE ACCESS YIELD MONITORING
    • INSTRUMENT CONTROL, AND IMAGING
    • FACIAL RECOGNITION COMES OF AGE
    • CHECKING OUT PRODUCT PACKAGES
STANDARDS AND REGULATIONS
    • NEW TEST STANDARDS FOR AUTO INDUSTRY
    • NIST CELEBRATES 100 YEARS
TEST INSTRUMENTATION
    • OPTICAL HEAD FOR TESTING LASER DIODES
    • AUDIO SPECTRAL ANALYSIS DMM
    • PCI BUS WAVEFORM DIGITIZERS
ULTRASONICS
    • DIGITAL FLAW DETECTOR
    • TESTING INJECTION NOZZLES
    • HANDHELD THICKNESS GAUGE INTRODUCED
    • RESEARCHERS COOK UP ULTRASOUND RECIPE
    • OFF-SHORE GAS LEAK DETECTION
    • AUTOMATED ROBOTIC INSPECTION SYSTEM
    • DETECTING HIDDEN AIRCRAFT DAMAGE
    • MODEL 5910PR PULSER-RECEIVER
    • INSPECTING POLISHED FIBER ENDS
    • SELF-CONTAINED VISION SENSOR
    • COGNEX INTRODUCES WAFER READER
    • DRAM WAFER INSPECTION SYSTEM
    • UV-SE THIN-FILM MEASUREMENT SYSTEM
    • WEB INSPECTION FOR THE NONWOVENS INDUSTRY
    • HANDHELD ULTRASONIC SOUND VELOCITY GAUGE
    • MODEL 5910PR PULSER-RECEIVER
    • SONATEST INTROS FLAW DETECTORS
    • PAINT REMOVAL AND REAL-TIME GAUGING
    • SOUND VELOCITY AND THICKNESS GAUGE
    • VELOCITY SENSOR MEASURES FLOW RATE
    • CLAMP-ON TRANSIT FLOWMETER
    • DEFECT DETECTION IN COMPOSITE ARMOR
    • DIGITAL FLAW DETECTOR
    • THE USN 58R FLAW DETECTOR
    • PORTABLE FLOWMETER FOR CLAMP-ON MEASUREMENT
    • COMPOSITE ELEMENT TRANSDUCERS
    • DETECTING LAND MINES
    • FLOW MEASUREMENT OF ALL LIQUIDS
    • BOLT STRESS METER
 

LIST OF TABLES

SUMMARY TABLE: U.S. SALES OF NDT SYSTEMS, THROUGH 2005  

LIST OF FIGURES

SUMMARY FIGURE: U.S. SALES OF NDT SYSTEMS, 2001 AND 2005
Description

[Report]
Non-Destructive Testing Industry Review
Published: 2002/06
Published by : BCC Research BCC Research

Price:
US $ 1,850.00 Hard Copy
US $ 2,150.00 PDF by E-mail
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Product Code : BC12582
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