Nondestructive Testing Industry Review

TABLE OF CONTENTS

INTRODUCTION

ACOUSTICS

• PIPELINE INSPECTION TOOL INTROS

AWARDS

• KEITHLEY RECEIVES INNOVATION AWARDS
• KEITHLEY AWARD IN MEASUREMENT
• KEITHLEY AWARD IN MEASUREMENT (CONTINUED)
• KLA-TENCOR RECEIVES TRAINING AWARD
• KEITHLEY BAGS INNOVATION AWARDS
• INVISION BAGS FORTUNE AWARD
• KEITHLEY GETS INNOVATION AWARD

BOOK AND PUBLICATIONS

• KEITHLEY PUBLISHES 2004 T&M CATALOG
• AMETEK U.S. GAUGE OFFERS PRODUCT CATALOG
• LEVEL MEASUREMENT CAPABILITIES GUIDE

DATA ACQUISITION

• MILLTRONICS MONITORS TALK TO INDUSTRIAL BUSES

EDDY CURRENT

• DUAL PROBE CONTROL SYSTEM
• PROBE UPDATE FROM TSC INSPECTION
• PHASEC 2D EC INSPECTION

ELECTROMAGNETICS

• RADAR ACCESSORIES OPTIMIZE LEVELS
• COST-EFFECTIVE LEVEL MEASUREMENT
• LEPTO-PEN GAUGES COATING THICKNESS
• 40GHZ PARAMETRIC TESTER OFFERED
• 40GHZ PARAMETRIC TESTER OFFERED (CONTINUED)
• RADIO WAVES DETECT MOISTURE IN WALLS
• ACFM RAIL TRACK INSPECTION
• ACFM RAIL TRACK INSPECTION (CONTINUED)
• ACFM RAIL TRACK INSPECTION (CONTINUED)

INDUSTRY NEWS

• U.S. SALES OF NDT SYSTEMS TO REACH $1.77 BILLION BY 2008
• Table 1 U.S. SALES OF NDT SYSTEMS, THROUGH 2008 ($ MILLIONS)
  • WORLDWIDE MEM/MST MARKET TO CROSS $26 BILLION BY 2007
    • WORLDWIDE MEM/MST MARKET TO CROSS .. (CONTINUED)
• Table 2 WORLDWIDE UNIT & DOLLAR SALES OF MEMS/MST PRODUCTS, THROUGH 2007 (MILLIONS)
  • HONG KON ORDERS AS&E SYSTEM
  • ELBIT ESTABLISHES PRESENCE IN CHINA
  • UPDATE ON VEECO/FEI MERGER ANNOUNCEMENT
  • FLIR RECEIVES SCANDINAVIA ORDERS
  • THERMO-ELECTRON UNITES LASERS AND PHOTONICS OFFERINGS
  • VARIAN ACQUIRES MRW GmbH
  • ZYGO RECEIVES CONTRACT EXTENSION
  • PAL SIGNS PACT WITH CAN
  • THERMA-WAVE SELECTED BY TOKYO ELECTRON
  • RUDOLPH SELECTED FOR INTEGRATED METROLOGY
  • ADE WINS JAPANESE ORDERS
  • AMETEK ACQUIRES AIRTECHNOLOGY HOLDINGS
  • CONGRESSMAN ATTENDS AS&E ROUNDTABLE
  • AS&E CEO ADDRESSES PORT SECURITY CONFERENCE
  • AS&E CEO ADDRESSES PORT SECURITY CONFERENCE (CONTINUED)
  • FEI GAINS FIRST VECTRA 986+ ORDERS
  • VEECO FEI NOT TO MERGE
  • INVISION RECEIVES U.S. EDS CONTRACT
  • QUANTUM AWARDED $3.49M FROM DOD
  • VEECO, SEMATECH WORK ON PHOTOMASKS
    • VEECO, SEMATECH WORK ON PHOTOMASKS (CONTINUED)
  • RVSI FACILITIES TO CONSOLIDATE
  • VEECO RECEIVES MBE ORDERS
  • EVEREST VIT CERTIFIED FOR F100 ENGINES
  • AGFA-GEVAERT DISINVESTS ITS NDT GROUP
  • n&k TO DELIVER SYSTEMS TO SELETE
  • ADE RECEIVES MULTIPLE ORDERS
  • AS&E GETS $6M AWARD
  • EVS INSPECTION SYSTEMS FOR CHINA
  • FEI OPENS FACILITY IN CZECH REPUBLIC
  • FLIR TEAMS WITH VISTASCAPE
    • FLIR TEAMS WITH VISTASCAPE (CONTINUED)
  • INVISION TO ACQUIRE YXLON
    • INVISION TO ACQUIRE YXLON (CONTINUED)
  • PPT OEM AGREEMENT WITH ISMECA
  • PPT VISION ANNOUNCES NEW DISTRIBUTOR
  • JAPANESE SELECT VEECO METROLOGY TOOL
  • VEECO RECEIVES MBE ORDERS
  • ZYGO BAGS CONTRACT FROM LLNL
  • CORRPRO SELLS BASS-TRIGON ASSETS
  • COGNEX ACQUIRES SIEMENS ID BUSINESS
  • FLIR IMAGERS TO BE USED IN OLYMPICS
  • INVISION BAGS INTERNATIONAL ORDERS
  • INVISION COMPLETES YXLON ACQUISITION
  • KLA-TENCOR OPENS TAIWAN CENTER
  • KLA-TENCOR SHIPS 100TH 300-MM SYSTEM
    • KLA-TENCOR SHIPS 100TH 300-MM SYSTEM (CONTINUED)
  • CUSTOMS SERVICE ORDERS ARACORS SYSTEMS
  • VEECO OPENS SHANGHAI OFFICE
  • VEECO LAUNCHES INTEGRATION CENTER
  • ZYGO EYES DEFENSE, AEROSPACE
  • EVEREST VIT GETS RVI RENEWAL
  • MATECH GOES INTERNATIONAL
  • CORRPRO TO SELL ROHRBACK COSASCO
  • COGNEX EXPANDS IN MACHINE VISION
  • AS&E GETS DOD ORDER
  • FEI ANNOUNCES ORDERS FOR TEM
  • 3-D METROLOGY FOR THIN-FILM HEADS
  • KEITHLEY AUTOMATES DIAGNOSTIC TESTS
  • ORDERS FOR BUMPED WAFER INSPECTION
  • USDATA, RVSI FORM ALLIANCE
  • SEMATECH INSTALLS VEECOS AFM
  • GE SUED OVER PANAMETRICS ACQUISITION
    • GE SUED OVER PANAMETRICS ACQUISITION (CONTINUED)
  • TRENCH MEASUREMENT SYSTEMS
  • COGNEX TO AWARD CONTINUING EDUCATION
  • NEW INTERIM CEO FOR AS&E
  • DOD ORDERS MORE MOBILESEARCH SYSTEMS
  • RADIOACTIVE THREAT DETECTION ADDED
  • NEW COO FOR FEIC
  • ARMY AWARDS CONTRACT TO FLIR
  • LOGAN AIRPORT ADDS SECURITY
    • LOGAN AIRPORT ADDS SECURITY (CONTINUED)
  • CAMERAS HELP COMBAT SARS
  • INVISION INVESTS IN SAFEVIEW
  • MINE DETECTION DEVELOPMENT AWARD
  • INVISION RECEIVES INTERNATIONAL ORDERS
  • RVSI GETS ASIAN ORDERS
  • ADE RECEIVES MULTIPLE ORDERS
  • TURKISH FABRIC FIRM SELECTS EVS
  • FEI RECEIVES NEW ORDERS
  • RVSI GETS WS-3000 ORDER
  • CORRPRO SELLS ASIAN OPERATION
  • FLIR TOPS NORTHWEST COMPETITION
  • WESDYNE NDE SERVICES
  • ADE RECEIVES LARGE ORDER
  • COGNEX EXPANDS INTO CHINA
  • FEI MAKING STRATEGIC ACQUISITIONS
  • INVISION SELLS 1,000TH EDS
  • JMAR DUMPS PRECISION EQUIPMENT
  • RVSI GETS VISIONSCAPE ORDER
  • SEMICONDUCTOR PACKAGE SINGULATION INSPECTION
  • RVSI RECEIVES ORDERS FOR SCANNERS
  • AMETEK ACQUIRES CHANDLER INSTRUMENTS
  • KLA-TENCOR WINS EXCELLENCE AWARD
    • KLA-TENCOR WINS EXCELLENCE AWARD (CONTINUED)
  • MARITIME THERMAL IMAGING SYSTEMS
  • AS&E ACHIEVES ISO 9001:2000
  • AVIATION SECURITY GROUP AT INVISION
  • YXLON ACQUIRES CT SYSTEMS PROVIDER
  • KEITHLEY, ZYVEX IN MARKETING AGREEMENT
  • TOSHIBA SELECTS KEITHLEY TEST SYSTEM
  • NEW GERMAN AMETEK DISTRIBUTOR
  • AS&E PRESENTS AT MARITIME EXPO
  • FEI OPENS NEW CAMPUS
  • FLIR AND INDIGO TO MERGE
  • THERMO SELLS T&M BUSINESS
  • AMD AWARDS KLA-TENCOR
  • INVISION IN DELOITTES TOP 5000
  • VARIAN ACQUIRES ZMED TECHNOLOGY
  • ROSEN RECEIVES LARGE CONTRACT
  • CONDITIONAL APPROVAL OF GE AGFA PURCHASE
  • KLA-TENCOR OPENS JAPAN CUSTOMER CENTER
  • PPT REGAINS NASDAQ COMPLIANCE
  • COGNEX SHIPS 200,000TH SYSTEM
  • RVSI FILES AMENDED SEC DOCUMENTS
  • VEECO BUYS EMCORES TURBODISC
    • VEECO BUYS EMCORES TURBODISC (CONTINUED)
  • VEECO PURCHASES ADVANCED IMAGING
    • VEECO PURCHASES ADVANCED IMAGING (CONTINUED)

INFRARED

• LANGLEY PROBES SCANNING THERMOGRAPHY
• ADVANCES IN THERMAL SENSING
• CAMERA WITH FIREWIRE OPTION
• CONTRACT FOR HANDHELD CAMERAS
• AIRBORNE IR SENSING TECHNOLOGY
  • AIRBORNE IR SENSING TECHNOLOGY (CONTINUED)
• HANDHELD E-SERIES CAMERAS
• BENCHTOP NIR ANALYZER
• TINY CAMERA FOR UAVs
• INDIGO SYSTEMS INTRODUCES VisGaAs

MAGNETIC TESTING

• SPEED CONTROL INSPECTION TOOL
  • SPEED CONTROL INSPECTION TOOL (CONTINUED)
  • SPEED CONTROL INSPECTION TOOL (CONTINUED)

MEASUREMENT

• KEITHLEY DEVELOPS NANOTECHNOLOGY SOLUTIONS
• U.S. SPECTROSCOPY MARKET TO REACH $4.3 BILLION BY 2007
  • U.S. SPECTROSCOPY MARKET .. (CONTINUED)
• Table 3 U.S. MARKET FOR SPECTROSCOPY, THROUGH 2007 ($ MILLIONS)

NEW RESEARCH

• SHEAROGRAPHIC SYSTEM FOR COMPONENTS
• ULTRASONIC INSPECTION OF ADHESIVE BONDS
• NDT OF TEA FERMENTATION
• ULTRALOW NOISE ULTRASOUND ELECTRONICS
• HOW GRAIN SIZE INFLUENCES ULTRASONICS
• X-RAY MICRO-TOMOGRAPHY
• ULTRASONIC INSPECTION OF TRAIN WHEELS
• IR THERMOGRAPHY FOR NDT OF BRIDGES
• COMPUTER VISION INSPECTS FOOD
• ULTRASONIC NDT OF ROCK BOLTS
• PLATE DETECTOR FOR RADIOGRAPHY
• IN SITU RELIABILITY MEASUREMENTS

NEW TECHNOLOGY

• DEPOSITING NANOPARTICLES ON SEMICONDUCTORS
  • DEPOSITING NANOPARTICLES ON SEMICONDUCTORS (CONTINUED)
• 3-D CHIP WITH FOUR WAFERS
• LASER TECHNIQUE DETECTS CAVITIES
• IR SPECTROSCOPY SCREENS MEAT
  • IR SPECTROSCOPY SCREENS MEAT (CONTINUED)
• HOLOGRAPHIC TECHNIQUE MEASURES VIBRATION
• IMAGING SUBSURFACE MICROSCOPIC DEFECTS
• TESTING COMPOSITE MILITARY MATERIALS
  • TESTING COMPOSITE MILITARY MATERIALS (CONTINUED)
• NDT METHODS FOR SHUTTLE COMPOSITES
  • NDT METHODS FOR SHUTTLE COMPOSITES (CONTINUED)
• FINDING DEFECTS IN SMALLEST SCALES
  • FINDING DEFECTS IN SMALLEST SCALES (CONTINUED)
• MICROWAVE TESTING OF SHUTTLE INSULATION
• TERAHERTZ TECHNIQUE FOR SHUTTLE DEFECTS
• MOBILE ROBOTS INSPECT GAS PIPES
  • MOBILE ROBOTS INSPECT GAS PIPES (CONTINUED)
• CORROSION INHIBITORS AS PENETRANT DYES
• USING CD PLAYERS TO SCREEN MOLECULES
  • USING CD PLAYERS TO SCREEN MOLECULES (CONTINUED)
• MEASURING FEATURES BY COUNTING ATOMS
• DUAL MICROSCOPES FOR SPOT DEFECTS
• DETECTING BIOLOGICAL WARFARE SENSORS
  • DETECTING BIOLOGICAL WARFARE SENSORS (CONTINUED)
• WEARABLE COMPUTERS TO DETECT CORROSION
  • WEARABLE COMPUTERS TO DETECT CORROSION (CONTINUED)
• X-RAY INSPECTION MEETS CHIP-MAKING
• AUTOMATED SENSOR NETWORK FOR DISASTERS
  • AUTOMATED SENSOR NETWORK FOR DISASTERS (CONTINUED)
  • AUTOMATED SENSOR NETWORK FOR DISASTERS (CONTINUED)

OPTICAL

• FILM INSPECTION, FLATNESS SYSTEM
• COGNEX INSPECTION SYSTEM IMPROVED
• 4TH-GENERATION SUPER CCD
  • 4TH-GENERATION SUPER CCD (CONTINUED)
• MEMS MEASUREMENT WITH OPTICAL PROFILER
• TableTOP UNIT FOR 3-D INSPECTION
• UV CAMERA INSPECTS ICs
• JET ENGINE INSPECTION SYSTEM
• KLA-TENCOR, MITSUBISHI EVALUATE OVERLAY
• LIVE FIBER DETECTOR
• FLATNESS METROLOGY TOOL DEBUTS
• IC INSPECTION BOTTLENECK BROKEN
  • IC INSPECTION BOTTLENECK BROKEN (CONTINUED)
• AUTOMATIC 3-D INSPECTION SYSTEM
• HIGH-SPEED INDUSTRIAL CAMERA
  • HIGH-SPEED INDUSTRIAL CAMERA (CONTINUED)
• VIDEOSCOPE KEEPS THE BORDER SECURE
• REMOTE VIDEO INSPECTION SYSTEMS
• DIGITAL CMOS VISION CAMERA
  • DIGITAL CMOS VISION CAMERA (CONTINUED)
• HIGH-PERFORMANCE FRAME GRABBERS
• PROCESS WINDOW QUALIFICATION
  • PROCESS WINDOW QUALIFICATION (CONTINUED)
• COSMETIC MAKER SELECTS COGNEX
• OPTICAL THIN-FILM METROLOGY SOLUTION
  • OPTICAL THIN-FILM METROLOGY SOLUTION (CONTINUED)
• RETICLE INSPECTION FOR SUB-90-NM ICS
• INLINE FOCUS-EXPOSURE MONITORING FOR LITHOGRAPHY
  • INLINE FOCUS-EXPOSURE MONITORING .. (CONTINUED)
• BRIGHTFIELD ILLUMINATION TO CAPTURE DEFECTS
  • BRIGHTFIELD ILLUMINATION TO CAPTURE DEFECTS (CONTINUED)
• LAND GRID ARRAY SOCKET INSPECTION
• METROLOGY OF STRAINED SILICON
• AUTOMATED STEEL QUALITY INSPECTION
• CORECO PARTNERS WITH TELI
• LOW-COST MACHINE VISION SYSTEM
• IMPROVEMENTS IN LEAD SCANNERS
  • IMPROVEMENTS IN LEAD SCANNERS (CONTINUED)
• WAFER INSPECTION SYSTEM IMPROVED
• MEMS METROLOGY TOOL DEBUTS
• COGNEX CHOSEN BY STEEL PRODUCER
• METROLOGY SOLUTION FOR 90-NM NODE
  • METROLOGY SOLUTION FOR 90-NM NODE (CONTINUED)
• KLA TEAMS WITH CARL ZEISS
  • KLA TEAMS WITH CARL ZEISS (CONTINUED)
• IMAGE MANAGEMENT FOR REMOTE OPERATION
• CD METROLOGY FOR MASKS AND RETICLES
• INSPECTION SYSTEM SAVES TIME
• MORE ORDERS FOR 200MM MEASUREMENT
• METAL FILMS METROLOGY
• LS-8000 LEAD SCANNER
• CAMERA INTERFACE FOR VISIONSCAPE
  • CAMERA INTERFACE FOR VISIONSCAPE (CONTINUED)
• HIGH PERFORMANCE MACHINE VISION
• VIDEO BORESCOPE SYSTEM INTROS
• 300-MM SYSTEM METROLOGY
• COGNEX LAUNCHES VISION INTEGRATOR PROGRAM
• LIMITS IN GEOMETRIC PATTERN MATCHING
• COGNEX INSPECTION PROOF IN PACKAGING
  • COGNEX INSPECTION PROOF IN PACKAGING (CONTINUED)
• IMPACT MACHINE-VISION MICRO-SYSTEM
• NETWORKED VISION SMART CAMERAS
  • NETWORKED VISION SMART CAMERAS (CONTINUED)
• PARTNERSHIP FOR WAFER METROLOGY
• MACHINE VISION FACTORY AUTOMATION
• OPTICAL DIGITAL PROFIOMETRY
• ADE INTROS WAFER SURFACE INSPECTION
• OVERLAY METROLOGY SOLUTION FOR 65-NM NODE
  • OVERLAY METROLOGY SOLUTION FOR 65-NM NODE (CONTINUED)
• MACHINE VISION LENS
• COST-EFFECTIVE PACKAGE TESTING

PATENTS

• METHOD FOR DIGITAL IMAGING
• LOOKING AT FERROUS METALS
• NEW APPLICATIONS
• APPROVED PATENTS
• TESTING FOR STRUCTURE DEFECTS
• TAKING A CLOSE LOOK AT STEEL

RADIOGRAPHY

• EUROCOPTER CHOOSES RADVIEW
• VARIAN EXHIBITS SECURITY PRODUCTS
• STANFORD ESTABLISHES NANOCHARACTERIZATION FACILITY
• PORTABLE X-RAY UNIT OFFERED
• CHARACTERISTICS
• SPECIAL FEATURES
• INSPECTING ALUMINUM VEHICLE WHEELS
• SUB-100-NM CRITICAL DIMENSION METROLOGY
• POSITRON SYSTEM GETS SBIR AWARD
  • POSITRON SYSTEM GETS SBIR AWARD (CONTINUED)
• FEI LAUNCHES A 90-NM NODE
• FEI LAUNCHES QUANTA SEM
• JMAR TO DEVELOP MONITORING TECHNOLOGY
• MOBILE X-RAY INSPECTION
• TYPICAL CHARACTERISTICS
• SPECIAL FEATURES
• X-RAY SCREENING VAN SYSTEM
• WEAPONS DETECTION USING TERAHERTZ RADIATION
• RADIATION DETECTION TECHNOLOGY
• AS&E INSPECTION SYSTEM FOR SINGAPORE
  • AS&E INSPECTION SYSTEM FOR SINGAPORE (CONTINUED)
• CHARACTERIZATION, REPAIR OF PHOTOLITH MASKS
• E-BEAM INSPECTION SYSTEM UNVEILED
  • E-BEAM INSPECTION SYSTEM UNVEILED (CONTINUED)
• REAL-TIME IN-FAB METROLOGY SYSTEM
  • REAL-TIME IN-FAB METROLOGY SYSTEM (CONTINUED)
• BETTER MATERIAL ANALYSIS USING SPMs
• DUALBEAM SYSTEMS FAMILY INTROS
  • DUALBEAM SYSTEMS FAMILY INTROS (CONTINUED)
• YXLON SELLS XES EDS
• DIMENSION X ATOMIC FORCE MICROSCOPE
• VX340 ATOMIC FORCE PROFILER
• INVISION GETS MORE EDS ORDERS
• LINATRON CARGO SCREENERS ORDERED
• COMPACT X-RAY INSPECTION SYSTEM
• DETECTING DAMAGE IN NICKEL SUPERALLOYS
• AS&E STRUTS ITS NEW TECHNOLOGY
  • AS&E STRUTS ITS NEW TECHNOLOGY (CONTINUED)
• VARIAN PARC TO DEVELOP SECURITY SYSTEM
• SBIR AWARD FOR POSITRON SYSTEMS
  • SBIR AWARD FOR POSITRON SYSTEMS (CONTINUED)
• DOD BUYS BACKSCATTER SCREENING SYSTEMS
• NEXT-GENERATION EXPLOSIVES DETECTION
• SEMICON METROLOGY WITH VX 340
• PARIS HIGHLIGHTS BACKSCATTER SYSTEM
• NDT OF SILICON CARBIDE WAFERS

SOFTWARE

• FATIGUE AND FRACTURE ANALYSIS
• CIMETRIX SELECTED FOR QUICK INTEGRATION
• BATCH TESTER FOR MATERIALS TESTING
• FAB-WIDE YIELD ANALYSIS SOFTWARE
• TRAINING, INSPECTION TOOLS FOR VISIONPRO
• DETECTING AIR LEAKS IN THE SPACE STATION
  • DETECTING AIR LEAKS IN THE SPACE STATION (CONTINUED)
• EASE-OF-USE SOFTWARE FOR IN-SIGHT
• IR SOFTWARE MODULES

ULTRASONICS

• APPLICATIONS FOR ULTRASONIC TECHNOLOGY CONTINUE TO EMERGE
  • APPLICATIONS FOR ULTRASONIC TECHNOLOGY .. (CONTINUED)
• Table 4 U.S. ULTRASONIC MARKET BY SEGMENT, THROUGH 2008 ($ MILLIONS)
  • MOSFET PAIR FOR PULSERS
  • 4-CHANNEL PULSER/RECEIVER
  • MAIN FEATURES
  • PULSER/RECEIVER BOARD FOR PCI BUS
    • PULSER/RECEIVER BOARD FOR PCI BUS (CONTINUED)
    • PULSER/RECEIVER BOARD FOR PCI BUS (CONTINUED)
  • LLOYDS APPROVES MILLTRONICS SYSTEMS
  • MILLTRONICS LEVEL DEVICE BAGS AWARD
  • DSP EMBEDDED UT BOARD
  • R/D TECHS OMNISCAN FAMILY
  • CONTINUOUS LEVEL MEASUREMENT
  • EPOCH 4 RENEWS OPERATING SOFTWARE
  • AUTO-V MODULES FOR UT THICKNESS GAUGE
  • CORROSION THICKNESS GAGE
  • R&D 100 AWARD FOR PNNL
  • FLAW DETECTOR WITH COLOR DISPLAY
  • R/D TECH LAUNCHES OMNISCAN
  • HOW TO MEASURE THIN PLASTICS
  • USM 35 FLAW DETECTOR
  • GE PANAMETRICS INTROS EMATs
  • MULTIRANGER IN PANEL-MOUNT VERSION

LIST OF TABLES

Table 1 U.S. SALES OF NDT SYSTEMS, THROUGH 2008 ($ MILLIONS)

Table 2 WORLDWIDE UNIT & DOLLAR SALES OF MEMS/MST PRODUCTS, THROUGH 2007 (MILLIONS)

Table 3 U.S. MARKET FOR SPECTROSCOPY, THROUGH 2007 ($ MILLIONS)

Table 4 U.S. ULTRASONIC MARKET BY SEGMENT, THROUGH 2008 ($ MILLIONS)