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[Report]
Microscopy Markets
Published: 2008/07
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Table of Contents
- 1 Overview
- 1.1 Statement of Report
- 1.2 Scope of This Report
- 1.3 Objectives
- 1.4 Methodology
- 1.5 Aims of This Report
- 1.6 Executive Summary
- 1.7 Trends and Conclusions
- 2 Introduction to Microscopy Markets
- 2.1 Overview of Microscopy Technologies
- 2.1.1 Introduction
- 2.1.2 Basic Optical Microscopy (OM)
- 2.1.3 Electron Microscopy (EM) and Other Charged-Particle Technologies
- 2.1.4 Advanced Optical Microscopy
- 2.1.5 Scanning Probe Microscopy (SPM)
- 2.1.6 Fourier Transform Infrared Microscopy (FT-IR)
- 2.1.7 Ultraviolet Microscopy (UVM)
- 2.1.8 Scanning Acoustic Microscopy (SAM)
- 2.1.9 X-Ray Microscopy / Microtomography (MCT, XMT, Micro-CT)
- 2.2 Market Perspective
- 2.3 Market Analysis
- 2.3.1 Market Size
- 2.3.2 Market Share
- 2.3.3 Key Players
- 2.3.4 Competition
- 2.3.5 Barriers to Growth
- 2.3.6 Market Drivers
- 2.4 Purchasers' Perspectives
- 3 In-Depth Discussion of Optical (Light) Microscopy (OM)
- 3.1 Lens Systems
- 3.2 Resolution
- 3.3 Illumination Systems
- 3.4 Innovations
- 3.5 Major Applications of Optical Microscopy
- 3.5.1 Semiconductor Manufacturing
- 3.5.2 Automated Medical Imaging
- 3.5.3 Market Drivers for Automated Systems for Semiconductor and
Medical Applications
- 3.5.4 Real-Time Imaging
- 4 In-Depth Discussion of Light-Based Fluorescence, Multi-Photon and
Confocal Microscopy
- 4.1 Fluorescence Microscopy
- 4.2 Total Internal Reflection Fluorescence Microscopy (TIRFM)
- 4.3 Multi-Photon Microscopy
- 4.3.1 Basic Principles
- 4.3.2 Lasers
- 4.3.3 Fluorophores for Multi-Photon Work
- 4.3.4 Uncaging
- 4.3.5 Autofluorescence
- 4.4 Laser Scanning Confocal Microscopy (Confocal, LSCM)
- 4.4.1 Basic Principles
- 4.4.2 Confocal System Types
- 4.4.3 Photobleaching
- 4.5 High-Throughput Fluorescence and Confocal Imaging Systems
- 4.6 Major Players and Products in Optical, Fluorescence, Multi-Photon
and Confocal Microscopy
- 4.6.1 BD (Becton, Dickinson and Company)
- 4.6.2 KLA-Tencor Corporation
- 4.6.3 Korima, Inc.
- 4.6.4 Leica Microsystems, Inc.
- 4.6.5 Nikon Instruments, Inc.
- 4.6.6 Nanomics Imaging, Inc.
- 4.6.7 Olympus Imaging America, Inc.
- 4.6.8 Veeco Instruments, Inc.
- 4.6.9 Carl Zeiss Microimaging, Inc.
- 4.6.10 Modular Confocal Scanners
- 5 In-Depth Discussion of Scanning Probe Microscopy (SPM), Including
Near-Field (NSOM) and Atomic Force Microscopy (AFM)
- 5.1 Introduction
- 5.2 Near-Field Scanning Optical Microscopy (NSOM)
- 5.2.1 Resonance Frequency
- 5.2.2 Aperture
- 5.2.3 Reflection Mode
- 5.3 Near-Field Scanning Thermal Microscopy (NThM)
- 5.4 Atomic Force Microscopy (AFM)
- 5.4.1 Semiconductor Applications
- 5.4.2 Magnetic Material Applications
- 5.4.3 Electrochemical Applications
- 5.4.4 Life Sciences Applications
- 5.5 Major Players and Products in Scanning Probe Microscopy (Including
Near-Field and Atomic Force)
- 5.5.1 Agilent Technologies
- 5.5.2 Asylum Research
- 5.5.3 JEOL USA, Inc.
- 5.5.4 KLA-Tencor Corporation
- 5.5.5 Nanonics Imaging, Ltd.
- 5.5.6 Omicron NanoTechnology GmbH
- 5.5.7 Veeco Instruments, Inc.
- 5.5.8 WITec Instruments Corp.
- 6 In-Depth Discussion of Infrared and Ultraviolet Microscopy
- 6.1 Fourier-Transfer Infrared Microscopy (FT-IR)
- 6.2 Ultraviolet Microscopy (UVM)
- 6.3 Major Players and Products for Infrared and Ultraviolet Microscopy
- 6.3.1 Bruker Optics, Inc.
- 6.3.2 Craic Technologies
- 6.3.3 KLA-Tencor Corporation
- 6.3.4 Korima, Inc.
- 6.3.5 Thermo Scientific
- 7 In-Depth Discussion of Scanning Acoustic Microscopy, X-Ray
Microtomography and Raman Spectroscopic Microscopy
- 7.1 Scanning Acoustic Microscopy (SAM)
- 7.2 X-Ray Microtomography (CTM, Micro-CT)
- 7.3 Raman Spectroscopic Microscopy
- 8 Major Players and Products in Acoustic Microscopy, X-Ray Microtomography
and Raman Microscopy
- 8.1 Major Players in Acoustic Microscopy
- 8.1.1 Sonix, Inc.
- 8.1.2 Sonoscan, Inc.
- 8.2 Major Players in X-Ray Microtomography
- 8.2.1 Cameca Instruments, Inc.
- 8.2.2 SkyScan
- 8.3 Major Players in Raman Microscopy
- 8.3.1 Horiba Jobin Yvon, Inc.
- 8.3.2 Renishaw, Inc.
- 8.3.3 Thermo Scientific
- 9 In-Depth Discussion of Electron Microscopy (EM) and Related
Charged-Particle Systems
- 9.1 Transmission Electron Microscope (TEM)
- 9.2 Scanning Electron Microscope (SEM)
- 9.2.1 Rastering
- 9.2.2 Exploring the Sample
- 9.2.3 Types of Image
- 9.2.4 Environmental SEM (ESEM) and Variable-Pressure SEM (VPSEM)
- 9.2.5 Low-Voltage SEM
- 9.2.6 Tabletop Models
- 9.2.7 Applications
- 9.3 Scanning/Transmission Electron Microscope (STEM)
- 9.4 Electron Probe Microanalyzer (EPMA, Microprobe)
- 9.5 Auger Electron Microscopy/Spectroscopy (AES, AEM, Auger)
- 9.6 Electron Beam (E-Beam) Lithography
- 9.7 Focused Ion Beam (FIB) and Dual-Beam Microscopes
- 9.8 Secondary Ion Mass Spectrometry (SIMS)
- 9.9 X-Ray Photoelectron Spectroscopy (XPS)/ Electron Spectroscopy for
Chemical Analysis (ESCA)
- 9.10 Scanning Helium Ion Beam Microscopy (SHIM)
- 10 Ancillary Analytical Attachments
- 10.1 Common/Historical Attachments
- 10.1.1 Energy-Dispersive (EDS) and Wavelength-Dispersive (WDS) X-ray
Microanalyzers
- 10.1.2 Electron Backscatter Diffraction (EBSD)
- 10.1.3 Cathodoluminescence (CL)
- 10.1.4 X-Ray Microtomography
- 10.1.5 Raman Spectroscopy
- 11 Major Players and Products in Electron Beam and Other Charged-Particle
Beam Microscopies
- 11.1 Cameca Instruments, Inc.
- 11.2 FEI Company
- 11.3 Hitachi High Technologies America, Inc.
- 11.4 JEOL USA, Inc.
- 11.5 KLA-Tencor Corporation
- 11.6 Omicron NanoTechnology GmbH
- 11.7 Vistec Lithography, Inc.
- 11.8 Carl Zeiss SMT Corporation
- 12 Company Profiles
- 12.1 Applied Materials, Inc.
- 12.2 Applied Precision, Inc.
- 12.3 Becton, Dickinson and Company
- 12.4 Bio-Rad Laboratories, Incorporated
- 12.5 Bruker Optics
- 12.6 Buehler
- 12.7 Cameca
- 12.8 Carl Zeiss, Inc.
- 12.9 Danish Micro Engineering A/S
- 12.10 FEI Company
- 12.11 Gatan
- 12.12 Genetix
- 12.13 Hitachi, Ltd.
- 12.14 Inami Corp.
- 12.15 IRIS International
- 12.16 JEOL
- 12.17 KLA-Tencor Corporation
- 12.18 Leica Microsystems (part of Danaher Corporation)
- 12.19 Medical Integrated Services (MIS)
- 12.20 Nanonics Imaging, Ltd.
- 12.21 Nikon, Inc.
- 12.22 NT-MDT
- 12.23 Obducat-CamScan
- 12.24 Olympus Corporation
- 12.25 Omicron Nanotechnology
- 12.26 Pacific Nanotechnology
- 12.27 Park Systems (formerly PSIA)
- 12.28 PerkinElmer
- 12.29 Quesant Instruments
- 12.30 Questar Corporation
- 12.31 Schott North America
- 12.32 Shimadzu Corporation
- 12.33 SII NanoTechnology
- 12.34 Thermo Fisher Scientific, Inc.
- 12.35 TM Microscopes (ThermoMicroscopes)
- 12.36 TriPath Imaging, Inc.
- 12.37 Veeco Instruments
- 12.38 WITec (Wissenschaftliche Instrumente und Technologie) GmbH
- 13 Company Directory
INDEX OF FIGURES
- Figure 2.1: Global Market for Microscopes, Accessories and Supplies,
2003-2012
- Figure 3.1: Basic Components of the Optical Microscope
- Figure 3.2: Stereo Microscope
INDEX OF TABLES
- Table 2.1: Global Market for Microscopes and Accessories, 2007-2013
- Table 2.2: Global Market for Optical Microscopes and Accessories
- Table 2.3: Global Market for Charged Particle Microscopes and Accessories
- Table 2.4: Global Market for Scanning Probe Microscopes and Accessories
- Table 3.1: Basic Components of the Optical Microscope
- Table 5.1: Types of Scanning Probe Microscopes
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[Report]
Microscopy Markets
Published: 2008/07
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Published by : Trimark Publications  |
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Price:
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Product Code : TK70125 |
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